The TEM is routinely used for characterising the microstructure at interfaces in ceramics, Metals and Biological samples. Morphology and distribution of nano-size particles, lattice imaging and chemical analysis can be studied.
The TEM is computer-controlled allowing users to record operation conditions, recall stored sample grid positions and perform low-dose imaging. This is useful for examining biological samples that are sensitive to the high-energy electron beam. To record high-resolution images using less energetic beams, the instrument is fitted with a Gatan Orius SC 1000 camera (2×4k) GIF Ultras-can camera (2k×2k), high-angle annular dark field detector, a Gatan annular dark field detector/bright field detector, as well as a Gatan Quantum image filter (GIF) system.
Further chemical analysis can be carried out on the Oxford Instruments INCA/Aztech EDS 80 mm X-Max detector system, which is capable of light-element (Z>5) and can be combined with STEM for nanometre spatial resolution.
Au nanoparticles and Convergent beam diffraction pattern.
Au nanoparticles and Convergent beam diffraction pattern 1
Au nanoparticles and Convergent beam diffraction pattern 2
STEM Image
Images JEOL JEM 2100F - bottom
Oxygen EDX Map
Aluminium EDX Map
Silicon EDX Map
JEOL JEM-2100F TEM help and support
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Dr Mahmoud Ardakani
Location
Department of Materials
Royal School of Mines
Lower Ground Floor, LG05