About this talk
Transmission electron microscopy (TEM) is one of the key tools for direct structural characterization of nano materials, providing a basis for understanding the correlation between synthesis, structure and physical properties. Over the last 10 years, transmission electron microscopy has been revolutionized by the advent of aberration correction providing true atomic resolution imaging for materials and by combining imaging techniques with local analytical capabilities at the sub nanometer length scale. With tomographic techniques, electron microscopy has developed from a 2D projection technique to provide a full 3D view, giving new insights into the structure of complex composites. In situ studies, where these techniques are used to follow the structural changes during mechanical or thermal testing, are expanding the possibilities further to get direct insights in the relevant processes. With this presentation, I will introduce state-of-the-art electron microscopy techniques with a special focus on electron tomography and in-situ mechanical & thermal testing. In addition to the method developments, the main aim of this presentation will be to illustrate the possibilities electron microscopy offers for characterizing complex nano materials such as silicon quantum dots based hybrid LEDs, self-assembled block-copolymers and Janus-type molecules, catalysts as well as nano crystalline metals and how this information helps to refine our understanding of their properties.