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More News@article{Hutchison:2024:10.1021/acs.jpcb.4c01492,
author = {Hutchison, CDM and Perrett, S and van, Thor JJ},
doi = {10.1021/acs.jpcb.4c01492},
journal = {The Journal of Physical Chemistry B},
title = {XFEL beamline optical instrumentation for ultrafast science},
url = {http://dx.doi.org/10.1021/acs.jpcb.4c01492},
year = {2024}
}
TY - JOUR
AB - Free electron lasers operating in the soft and hard X-ray regime provide capabilities for ultrafast science in many areas, including X-ray spectroscopy, diffractive imaging, solution and material scattering, and X-ray crystallography. Ultrafast time-resolved applications in the picosecond, femtosecond, and attosecond regimes are often possible using single-shot experimental configurations. Aside from X-ray pump and X-ray probe measurements, all other types of ultrafast experiments require the synchronized operation of pulsed laser excitation for resonant or nonresonant pumping. This Perspective focuses on the opportunities for the optical control of structural dynamics by applying techniques from nonlinear spectroscopy to ultrafast X-ray experiments. This typically requires the synthesis of two or more optical pulses with full control of pulse and interpulse parameters. To this end, full characterization of the femtosecond optical pulses is also highly desirable. It has recently been shown that two-color and two-pulse femtosecond excitation of fluorescent protein crystals allowed a Tannor-Rice coherent control experiment, performed under characterized conditions. Pulse shaping and the ability to synthesize multicolor and multipulse conditions are highly desirable and would enable XFEL facilities to offer capabilities for structural dynamics. This Perspective will give a summary of examples of the types of experiments that could be achieved, and it will additionally summarize the laser, pulse shaping, and characterization that would be recommended as standard equipment for time-resolved XFEL beamlines, with an emphasis on ultrafast time-resolved serial femtosecond crystallography.
AU - Hutchison,CDM
AU - Perrett,S
AU - van,Thor JJ
DO - 10.1021/acs.jpcb.4c01492
PY - 2024///
SN - 1520-6106
TI - XFEL beamline optical instrumentation for ultrafast science
T2 - The Journal of Physical Chemistry B
UR - http://dx.doi.org/10.1021/acs.jpcb.4c01492
UR - http://hdl.handle.net/10044/1/113722
ER -