The Local Electrode Atom Probe (LEAP 5000) allows nanoscale analysis of typical volumes of 50 nm x 50 nm x 100 nm with ppm compositional sensitivity and up to 0.2 nm spatial resolution in the analysis direction.

It is equipped with a high-frequency laser pulsing system to analyse non-conductive materials and insulators and an energy-compensating lens for optimal mass-resolving power. Atom probe microscopy can detect all elements equally (including hydrogen) and allows 3D reconstructions of nanoscale segregation within sample volumes.

The LEAP 5000XR is fitted with a FerroVac cryo/vacuum transfer suitcase, which can dock directly with the Hydra DualBeam and the glovebox for the movement of environmentally sensitive samples.