Microscopic Image Deblurring by a Generative Adversarial Network for 2D Nanomaterials: Implications for Wafer-Scale Semiconductor Characterization - Dong,X; Zhang,Y; Li,H; Yan,Y; Li,J; Song,J; Wang,K; Jakobi,M; Yetisen,AK; Koch,AW (ACS APPLIED NANO MATERIALS, 2022)