Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors - Yun, D-J; Lee, S; Kim, SH; Jung, C; Kim, YS; Chung, JG; Heo, S; Kwon, Y-N; Lee, E; Kim, J-S; Ko, D-S; Kim, SY (SMALL METHODS, 2021)