In our Electrical Lab, we have a range of facilities, two probe stations, which can analyse devices in a temperature range 77K to 500K, a Frequency range of DC – 65GHz, external Magnetic bias up to 0.15tesla in both vertical and horizontal directions.
Our full list of facilities are listed below.
On Chip Measurements
Model: Janis Microwave (MW) Cryo Probe Station
The Microwave (MW) Cryo-probe Station is designed to provide affordable vacuum and cryogenic probing of wafers and devices. The on-wafer measurements could be performed under external electrical bias, and magnetic field (up to 0.15 T) applied in horizontal or vertical directions, in wide temperature (10 K – 600 K) and frequency (d.c. – 65 GHz) ranges. The system can be used in various fields, including superconductivity, MEMS, ferroelectrics, nanoscale electronics, material sciences, and optics.
Model: Signatone S-1160
The room-temperature probe station is used to perform electrical measurements on devices at room temperature; ideal equipment for a multi-purpose analytical platform. It can be used to probe small or large geometries by fitting with either high- or low-powered optics. It is also designed to support various precision probing applications, including MCMs, hybrids and wafers. It is also compatible with magnetic and vacuum base micro-positioners. In addition, it has a purpose-built heating stage that allows measurement at temperatures up to 250°C with 0.1°C accuracies.
Capacitance
Model: Keysight B1500A
The Semiconductor Analyser provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency. It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.
Model: Agilent 4287A RF LCR Meter
The 4287A RF LCR Meter offers accurate, reliable and fast measurements from 1 MHz to 3 GHz to improve the quality and throughput of electronic component testing in production lines. The 4287A employs the direct-current voltage-measurement technique instead of the reflection-measurement technique, which yields accurate measurements over a wide impedance range.
Model: Keysight P5008A Vector Network Analyser 100 kHz - 53 GHz
This is a flexible, high-performance, compact VNA that provides a frequency range of 100 kHz to 53 GHz. It allows a wide range of measurement applications to gain deeper insight into your RF test.
It features the same intuitive GUI as Keysight’s high-performance PNAs.
Current-Voltage
Keithley’s Series 2600B System SMU instruments are the industry standard current-voltage source and measure solution for highly automated production test applications. Both dual- and single-channel models tightly integrate a precision power supply, accurate current source, DMM, and electronic load with a pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high-volume parallel tests.
Model: Keysight B1500A
It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.
It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.
Diode/Transistors Measurements
Model: Keysight B1500A
It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.
It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.
High-Frequency Measurements
Vector Network Analyzer (VNA)
Model: Keysight P5008A Vector Network Analyser 100 kHz - 53 GHz
This is a flexible, high-performance, compact VNA that provides a frequency range of 100 kHz to 53 GHz. It allows a wide range of measurement applications to gain deeper insight into your RF test. It features the same intuitive GUI as Keysight’s high-performance PNAs.
Ferroelectric Properties
Ferroelectric tester
Model: Radiant Technologies Precision System
The Precision RT66C is perfect for a researcher looking for a flexible unit at an affordable price. The RT66C Test System has a hysteresis frequency rating of 1KHz.
Our RT66C has a +/- 200V built-in drive-volt option as well as a 10kV High Voltage Interface and a High Voltage Amplifier.
How to access
To access our facilities, please email royce@imperial.ac.uk.