In this section
@article{Dong:2019:1882-0786/ab3e51,
author = {Dong, X and Dong, J and Yetisen, AK and Koehler, MH and Wang, S and Jakobi, M and Koch, AW},
doi = {1882-0786/ab3e51},
journal = {Applied Physics Express},
title = {Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy},
url = {http://dx.doi.org/10.7567/1882-0786/ab3e51},
volume = {12},
year = {2019}
}
TY - JOUR
AB - A micro-reflectance imaging system based on hyperspectral line-scanning microscope is developed for surface characterization and thickness mapping of two-dimensional MoS2. The hyperspectral datacube of region of interest (120 × 200 μm2) is obtained with microscale spatial resolution. Single-band quantitative analysis shows distributions of different thicknesses with wavelength variations. The excitonic peak with position around 655 nm is measured by differential reflectance analysis. Peak position mapping is employed for imaging MoS2 flakes with specific thickness and reconstructed images perform the same region of interest with high accuracy. The developed micro-reflectance imaging system has applications in laboratory analyses and industrial monitoring of 2D materials.
AU - Dong,X
AU - Dong,J
AU - Yetisen,AK
AU - Koehler,MH
AU - Wang,S
AU - Jakobi,M
AU - Koch,AW
DO - 1882-0786/ab3e51
PY - 2019///
SN - 1882-0778
TI - Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy
T2 - Applied Physics Express
UR - http://dx.doi.org/10.7567/1882-0786/ab3e51
UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000484527100004&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR - https://iopscience.iop.org/article/10.7567/1882-0786/ab3e51
VL - 12
ER -