In this section
@article{Dong:2022:10.1002/adts.202200140,
author = {Dong, X and Li, H and Yan, Y and Cheng, H and Zhang, HX and Zhang, Y and Le, TD and Wang, K and Dong, J and Jakobi, M and Yetisen, AK and Koch, AW},
doi = {10.1002/adts.202200140},
journal = {ADVANCED THEORY AND SIMULATIONS},
title = {Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors},
url = {http://dx.doi.org/10.1002/adts.202200140},
year = {2022}
}
TY - JOUR
AU - Dong,X
AU - Li,H
AU - Yan,Y
AU - Cheng,H
AU - Zhang,HX
AU - Zhang,Y
AU - Le,TD
AU - Wang,K
AU - Dong,J
AU - Jakobi,M
AU - Yetisen,AK
AU - Koch,AW
DO - 10.1002/adts.202200140
PY - 2022///
TI - Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors
T2 - ADVANCED THEORY AND SIMULATIONS
UR - http://dx.doi.org/10.1002/adts.202200140
UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000823996100001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
ER -